Volume 46, Issue S1 p. 52-52
Session 12: Oxide TFTs

Paper No S12.2: High-Mobility Indium Oxide Thin-Film Transistors by Means of Plasma-Enhanced Atomic Layer Deposition

H. I. Yeom

H. I. Yeom

KAIST, Daejeon, Republic of Korea

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J. B. Ko

J. B. Ko

KAIST, Daejeon, Republic of Korea

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C.-S. Hwang

C.-S. Hwang

ETRI, Daejeon, Republic of Korea

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S. Cho

S. Cho

ETRI, Daejeon, Republic of Korea

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S.-H. K. Park

Corresponding Author

S.-H. K. Park

KAIST, Daejeon, Republic of Korea

E-mail: [email protected]Search for more papers by this author
First published: 22 September 2015
Citations: 1

Abstract

Indium oxide film has been deposited by plasma-enhanced atomic layer deposition and adopted as channel materials for high-mobility thin-film transistors. The resultant device fabricated at temperature of 200° showed a field-effect mobility of as high as 31 cm2/V s in linear region.